<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Richard E. Russo</style></author><author><style face="normal" font="default" size="100%">Xianglei Mao</style></author><author><style face="normal" font="default" size="100%">Wing-Tat Chan</style></author><author><style face="normal" font="default" size="100%">Bryant, M. F.</style></author><author><style face="normal" font="default" size="100%">Kinard, W. F.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Laser-Ablation Sampling with Inductively-Coupled Plasma-Atomic Emission-Spectrometry for the Analysis of Prototypical Glasses</style></title><secondary-title><style face="normal" font="default" size="100%">Journal of Analytical Atomic Spectrometry</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">248 nm</style></keyword><keyword><style  face="normal" font="default" size="100%">266 nm</style></keyword><keyword><style  face="normal" font="default" size="100%">ablation</style></keyword><keyword><style  face="normal" font="default" size="100%">ablation rate</style></keyword><keyword><style  face="normal" font="default" size="100%">analysis</style></keyword><keyword><style  face="normal" font="default" size="100%">atomic emission</style></keyword><keyword><style  face="normal" font="default" size="100%">atomic emission spectrometry</style></keyword><keyword><style  face="normal" font="default" size="100%">atomic-emission</style></keyword><keyword><style  face="normal" font="default" size="100%">atomic-emission-spectrometry</style></keyword><keyword><style  face="normal" font="default" size="100%">composition</style></keyword><keyword><style  face="normal" font="default" size="100%">direct solid sampling</style></keyword><keyword><style  face="normal" font="default" size="100%">dissolution</style></keyword><keyword><style  face="normal" font="default" size="100%">e</style></keyword><keyword><style  face="normal" font="default" size="100%">element</style></keyword><keyword><style  face="normal" font="default" size="100%">emission</style></keyword><keyword><style  face="normal" font="default" size="100%">emission spectrometry</style></keyword><keyword><style  face="normal" font="default" size="100%">emission-spectrometry</style></keyword><keyword><style  face="normal" font="default" size="100%">england</style></keyword><keyword><style  face="normal" font="default" size="100%">excimer</style></keyword><keyword><style  face="normal" font="default" size="100%">excimer laser</style></keyword><keyword><style  face="normal" font="default" size="100%">excimer-laser</style></keyword><keyword><style  face="normal" font="default" size="100%">glass</style></keyword><keyword><style  face="normal" font="default" size="100%">glass samples</style></keyword><keyword><style  face="normal" font="default" size="100%">glasses</style></keyword><keyword><style  face="normal" font="default" size="100%">inductively coupled plasma</style></keyword><keyword><style  face="normal" font="default" size="100%">inductively coupled plasma atomic emission spectrometry</style></keyword><keyword><style  face="normal" font="default" size="100%">inductively-coupled-plasma</style></keyword><keyword><style  face="normal" font="default" size="100%">krf</style></keyword><keyword><style  face="normal" font="default" size="100%">krf excimer laser</style></keyword><keyword><style  face="normal" font="default" size="100%">laser</style></keyword><keyword><style  face="normal" font="default" size="100%">laser ablation</style></keyword><keyword><style  face="normal" font="default" size="100%">laser ablation sampling</style></keyword><keyword><style  face="normal" font="default" size="100%">laser sampling</style></keyword><keyword><style  face="normal" font="default" size="100%">laser-ablation</style></keyword><keyword><style  face="normal" font="default" size="100%">mass</style></keyword><keyword><style  face="normal" font="default" size="100%">mass-spectrometry</style></keyword><keyword><style  face="normal" font="default" size="100%">matrix</style></keyword><keyword><style  face="normal" font="default" size="100%">nanosecond</style></keyword><keyword><style  face="normal" font="default" size="100%">nd:yag</style></keyword><keyword><style  face="normal" font="default" size="100%">nd:yag laser</style></keyword><keyword><style  face="normal" font="default" size="100%">nm</style></keyword><keyword><style  face="normal" font="default" size="100%">picosecond</style></keyword><keyword><style  face="normal" font="default" size="100%">plasma</style></keyword><keyword><style  face="normal" font="default" size="100%">precision</style></keyword><keyword><style  face="normal" font="default" size="100%">preferential vaporization</style></keyword><keyword><style  face="normal" font="default" size="100%">products</style></keyword><keyword><style  face="normal" font="default" size="100%">quantitative analysis</style></keyword><keyword><style  face="normal" font="default" size="100%">quantitative-analysis</style></keyword><keyword><style  face="normal" font="default" size="100%">ratio</style></keyword><keyword><style  face="normal" font="default" size="100%">ratios</style></keyword><keyword><style  face="normal" font="default" size="100%">repetition rate</style></keyword><keyword><style  face="normal" font="default" size="100%">river</style></keyword><keyword><style  face="normal" font="default" size="100%">sample</style></keyword><keyword><style  face="normal" font="default" size="100%">samples</style></keyword><keyword><style  face="normal" font="default" size="100%">sampling</style></keyword><keyword><style  face="normal" font="default" size="100%">science</style></keyword><keyword><style  face="normal" font="default" size="100%">silicon</style></keyword><keyword><style  face="normal" font="default" size="100%">single</style></keyword><keyword><style  face="normal" font="default" size="100%">spectrometry</style></keyword><keyword><style  face="normal" font="default" size="100%">standard</style></keyword><keyword><style  face="normal" font="default" size="100%">technology</style></keyword><keyword><style  face="normal" font="default" size="100%">time</style></keyword><keyword><style  face="normal" font="default" size="100%">vaporization</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">1995</style></year></dates><volume><style face="normal" font="default" size="100%">10</style></volume><pages><style face="normal" font="default" size="100%">295-301</style></pages><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">Laser ablation sampling is Presented as an alternative to dissolution procedures for elemental analyses of prototypical glasses using inductively coupled plasma atomic emission spectrometry. These glass samples were prototypes of vitrified waste products from the Savannah River Technology Center. The samples were not translated or rotated during laser sampling, but were repetitively sampled at a single spot using a KrF excimer laser with a 10 Hz repetition rate. The time-dependent mass ablation rate was measured and is discussed. Silicon, the major element in the matrix, was used as an internal standard, and excellent precision (s(r) = 1-3%) was obtained. Quantitative analysis was demonstrated using known prototypical glass compositions.; Preferential vaporization was investigated by comparing measured elemental ratios using a nanosecond excimer laser (lambda = 248 nm) and a picosecond Nd:YAG laser (fourth harmonic, lambda = 266 nm)</style></abstract><accession-num><style face="normal" font="default" size="100%">61</style></accession-num><notes><style face="normal" font="default" size="100%">NOT IN FILE</style></notes><auth-address><style face="normal" font="default" size="100%">UNIV HONG KONG,DEPT CHEM,HONG KONG,HONG KONG WESTINGHOUSE SAVANNAH RIVER CO,SAVANNAH RIVER TECH CTR,AIKEN,SC 29808 COLL CHARLESTON,DEPT CHEM,CHARLESTON,SC 29424</style></auth-address><label><style face="normal" font="default" size="100%">Laser</style></label></record></records></xml>