Jonathan L Slack

Jonathan Slack

Windows and Envelope Materials
Lawrence Berkeley National Laboratory
1 Cyclotron Road MS 90R3074
Berkeley CA 94720
Office Location: 90-3080
(510) 486-4148

This publications database is an ongoing project, and not all Division publications are represented here yet.



Richardson, Thomas J., Jonathan L. Slack, and Michael D. Rubin. "Electrochromism in Copper Oxide Thin Films." In 4th International Meeting on Electrochromism. Uppsala, Sweden, 2000. Download: PDF (211.49 KB)


Richardson, Thomas J., Klaus von Rottkay, Jonathan L. Slack, Franck Michalak, and Michael D. Rubin. "Tungsten-Vanadium Oxide Sputtered Films for Electrochromic Devices." In Electrochemical Society: Molecular Functions of Electroactive Thin Films. Vol. 98-26. Boston, MA, 1998. Download: PDF (200.54 KB)


von Rottkay, Klaus, Thomas J. Richardson, Michael D. Rubin, Jonathan L. Slack, and Lisen Kullman. "Influence of stoichiometry on the electrochromic cerium-titanium oxide compounds." In 11th International Conference of Solid State Ionics. Honolulu, Hawaii, 1997. Download: PDF (205.33 KB)


Wen, Shi-Jie, John B. Kerr, Michael D. Rubin, Jonathan L. Slack, and Klaus von Rottkay. "Analysis of Durability in Lithium Nickel Oxide Electrochromic Materials and Devices." In 2nd International Meeting on Electrochromism. San Diego, CA, 1996. Download: PDF (154.42 KB)
Rubin, Michael D., Klaus von Rottkay, Shi-Jie Wen, Nilgün Özer, and Jonathan L. Slack. "Optical Indices of Lithiated Electrochromic Oxides." Solar Energy Materials and Solar Cells 54, no. 1-4 (1996): 49-57. Download: 

Portrait Photos

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