
| Title | Characterization of HTSC thin films with Raman scattering |
| Publication Type | Book Chapter |
| Year of Publication | 1992 |
| Authors | Faulques, E., Richard E. Russo, and D. L. Perry |
| Secondary Title | Analytical Techniques for the Characterization of Materials |
| Publisher | Plenum |
| Publication Language | eng |
| Accession Number | 22 |
| Keywords | characterization, film, films, material, raman, raman scattering, raman-scattering, scattering, thin, thin film, thin films, thin-film, thin-films |
| Notes | LBNL-31913 NOT IN FILE |
| LBNL Report Number | LBNL-31913 |
| Citation Key | 14275 |